JEDEC JESD22-B109 Die Shear Testing in Assembly Process

JEDEC JESD22-B109 Die Shear Testing in Assembly Process

JEDEC JESD22-B109 Die Shear Testing in Assembly Process

The JEDEC standard JESD22-B109 is a critical specification for semiconductor and microchip testing, particularly focusing on the die shear strength during the assembly process. This test evaluates the mechanical integrity of the bond between the die and its package or substrate, ensuring that the assembly can withstand stress without failure.

Die shear tests are essential in validating the robustness of the packaging design against potential damage from handling and assembly processes such as reflow soldering, wave soldering, and automated component placement. The test method provides a standardized approach to assess die shear strength under defined conditions, which helps ensure product reliability and durability.

The testing procedure involves bonding a die to a carrier using an adhesive or other suitable means, then applying a force perpendicular to the bond line until failure occurs. The force at which this happens is recorded as the die shear strength. This value is critical for quality assurance teams to ensure that the assembly meets industry standards and performance requirements.

Compliance with JESD22-B109 is especially important in sectors like automotive, aerospace, and medical electronics, where reliability and durability are paramount. In these industries, even minor defects during the die shear test can lead to catastrophic failures once the product is deployed. Therefore, thorough testing and adherence to this standard are non-negotiable.

For R&D engineers, understanding the nuances of JESD22-B109 helps in designing more robust packages that can withstand high-stress environments. Quality managers rely on these tests to ensure consistency across production batches, while compliance officers use them as a benchmark for regulatory and internal audits.

The test setup typically includes specialized fixtures capable of applying controlled forces perpendicular to the bond line between die and carrier. The force application is often automated, ensuring precise control over the testing parameters. Once the specimen fails, the applied force is measured with high precision to determine the die shear strength.

Compliance with JESD22-B109 not only ensures product reliability but also supports sustainability efforts by reducing waste and improving efficiency in production processes. By ensuring that assemblies meet robustness standards early in the development cycle, manufacturers can prevent costly rework and recalls later on.

Industry Applications
Industry Segment Application
Aerospace & Defense Ensuring aerospace components can withstand extreme conditions.
Medical Electronics Guaranteeing the reliability of medical devices in critical environments.
Automotive Industry Evaluating durability and safety in automotive applications.

Environmental and Sustainability Contributions

  • Reduction of production waste by ensuring first-time quality success.
  • Minimization of rework costs through early identification of defects.
  • Promotion of sustainable manufacturing practices by enhancing product reliability.
  • Enhanced compliance with environmental regulations by minimizing product failures in the field.

Use Cases and Application Examples

The JEDEC JESD22-B109 die shear test is widely used in various industries to ensure that semiconductor packages can withstand mechanical stresses during assembly. One common use case involves testing the bond strength of flip-chip packages, where the die is mounted directly onto a substrate with minimal underfill.

In aerospace applications, this test ensures that electronic components can endure harsh environmental conditions without failing. For instance, it has been used to evaluate the reliability of GPS modules in satellite communications systems. Similarly, in medical devices, ensuring robust packaging is vital for maintaining sterility and preventing contamination during implantation procedures.

Automotive manufacturers use this test extensively to ensure that electronic control units (ECUs) can withstand the rigors of road testing and real-world driving conditions. By adhering to JESD22-B109, these manufacturers not only meet regulatory requirements but also enhance the safety and performance of their vehicles.

Frequently Asked Questions

What is the significance of JESD22-B109 in semiconductor testing?
JESD22-B109 provides a standardized method for evaluating die shear strength, which ensures that packaging assemblies can withstand mechanical stresses during assembly. This test helps prevent failures and enhances product reliability.
Who should perform the JESD22-B109 test?
What kind of equipment is required for the JESD22-B109 test?
Specialized fixtures capable of applying controlled forces perpendicular to the bond line between die and carrier are essential. The force application should be automated for precision.
How often should JESD22-B109 tests be conducted?
Tests should be conducted regularly during production and at key stages of the development cycle. Frequency depends on the specific requirements and quality standards of the industry sector.
What are the consequences of failing a JESD22-B109 test?
Failing this test can lead to product recalls, increased production costs due to rework or redesign, and potential safety issues in critical applications like aerospace and medical devices.
How does JESD22-B109 contribute to sustainability?
By ensuring product reliability early in the development cycle, it reduces waste and minimizes rework costs. This contributes to more efficient manufacturing processes and reduced environmental impact.
Can JESD22-B109 be customized for specific applications?
Yes, while the standard provides a robust framework, it can be adapted to suit specific industry requirements and test parameters.
What are the key factors affecting die shear strength in JESD22-B109?
Key factors include the type of adhesive used, surface preparation of the carrier and die, temperature conditions during bonding, and the force applied during testing.

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