IEC 61000-4-27 Power Frequency Conducted Emissions Testing
The IEC 61000-4-27 standard provides a framework for testing conducted emissions in the frequency range of 150 kHz to 30 MHz. This is critical for ensuring that electronic devices and systems, including semiconductors and microchips, do not disturb or interfere with other equipment within their environment. This service is particularly vital for semiconductor manufacturers who require stringent compliance to ensure compatibility and reliability across diverse applications.
The conducted emissions testing aims to identify any unwanted signals that can be transmitted through wires and cables from the device under test (DUT) to its surroundings, which could potentially lead to interference with other equipment. Conducted emissions are typically categorized into two types: common-mode emissions and normal-mode emissions. Common-mode emissions refer to signals that appear on both lines of a balanced pair or between the signal line and the shield in an unbalanced cable, while normal-mode emissions occur when there is differential current flow.
The testing process involves placing the DUT into a屏蔽模式
